In this application, the SPU module is used for optical thin film thickness measurement. It can measure film thicknesses above 1 µm. Open source software for this system is readily available on the Raspberry Pi platform, allowing easy integration into inspection systems for various applications.
Features
- Simplified measurement
- Python source code available
- Compact size
- Compatible with Linux platform (Raspberry Pi)
- Real-time monitoring of interference patterns
Configuration Example
Specification
Principles
Interference spectra are utilized for measuring film thickness.
A sample is exposed to white light, which produces a characteristic spectrum that is affected by the film thickness. By analyzing the interference spectra, the film’s thickness can be determined with accuracy.
